Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance.

Abstract: Vertical channel-all-around (CAA) thin-film transistors (TFTs) based on amorphous InGaZnO (a-IGZO) show significant potential for innovative dynamic random access memory (DRAM) integration ...

Abstract: Pentacene organic thin-film transistors (OTFTs) with HfLaON high-k gate dielectric have been fabricated using various gate-electrode materials, including different metals (Al, Au, Cu, Cr, Ti ...

Prime Minister Narendra Modi will inaugurate US-based chipmaker Micron Technology’s semiconductor assembly and testing plant ...