The research 'Impact of Contact Gating on Scaling of Monolayer 2D Transistors Using a Symmetric Dual-Gate Structure' appeared ...
A common lab setup can inflate 2D transistor performance by up to five times, raising questions about how future chips are ...
Throughout the 20th century, each decade had its own unique set of inventions that left their mark on history. Curious about ...
Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.
For nearly two decades, two-dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising smaller, faster and more energy-efficient ...
Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.
Abstract: A novel superconducting device based on voltage-controlled critical current suppression has been demonstrated, with the capability of being employed as a superconducting three-terminal ...
Morning Overview on MSN
Atom-thin electronics shrug off space radiation and could orbit for centuries
A team led by Peng Zhou at Fudan University has built a radio-frequency communication system from atomically thin molybdenum ...
Interesting Engineering on MSN
New radiation-resistant electronic circuit can last for over 270 years in harsh space
Space is unforgiving to electronics. Beyond Earth’s protective magnetic field, satellites are bombarded by ...
Adding big blocks of SRAM to collections of AI tensor engines, or better still, a waferscale collection of such engines, turbocharges AI inference, as has ...
By applying voltage to electrically control a new "transistor" membrane, researchers at Lawrence Livermore National Laboratory (LLNL) achieved real-time tuning of ion separations—a capability ...
Abstract: The gate charge required to turn on a MOS transistor is closely related to oxide damage and can therefore be used as an indicator of device reliability and aging over the lifetime of power ...
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