MSU facility lets microchip-makers do outer space tests here on Earth

When electronics meet cosmic rays, bad things can happen. Chip makers need to test what their products can withstand, and they now can at MSU.
The Manila Times

EXEED RX PHEV Conquers 41° Snow-Covered Slopes in Almaty with Texxeract Technology

Champion Driver Vladimir Borodin Conquers 41° Snow-Covered Slopes in the EXEED RX PHEV ...

TESCO Asia Introduces IEC Meter Adapter (Cat# 1186) to Support Dual-Standard Meter Testing Across International Markets

Enables ANSI-based Test Infrastructure to Seamlessly Accommodate Global IEC Meters Utilities across Southeast Asia, ...

Stop Wasting Money: The Hidden Energy Vampire Draining Your Wallet

Tired of spending all your money on electricity bills? Blame the energy vampires in your home. Those include things like ...
IEEE

Online Test-Time Adaptation for Electronic Nose Drift Compensation

Abstract: Sensor drift is a common problem in E-nose systems. In recent years, research on this problem has made significant progress, and various drift compensation methods have emerged. Although ...
IEEE

Guest Editorial Special Issue on Design and Testing Methods of Power Electronics Components and Circuits

Abstract: Safe and reliable operation is always a crucial consideration in many important applications of power electronics. Nowadays, the working conditions or mission profiles of power electronics ...