Call of Cthulhu’s newest book, Campfire Tales: Scouts Against Cthulhu, lets you take on horrors from beyond the stars AND ...
Abstract: Defect pattern recognition (DPR) of wafer maps is critical for determining the root cause of production defects, which can provide insights for the yield improvement in wafer foundries.
Abstract: Audio pattern recognition is an important research topic in the machine learning area, and includes several tasks such as audio tagging, acoustic scene classification, music classification, ...
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