Abstract: A historical review of E-Model development for time-dependent dielectric breakdown (TDDB) is presented. The E-Model tends to be a very useful reliability assurance model for TDDB because of ...
Abstract: In this manuscript, we have investigated the impact of the scaling of the gate-source length (LGS) and gate length (LG) on the on-state breakdown voltage (BVon) of metallic-face ...
Good morning, BBN! There will be football played at Kroger Field today as the Will Stein era gets kicked off with the return ...
Mountain Grass Unit, the Birmingham-based up-and-coming progressive bluegrass band, returned to Gainesville’s Heartwood ...
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