EPC Highlights Gen 7 GaN for AI Infrastructure and GaN Integrated Circuits for Robotics at APEC 2026
Enabling scalable power for AI computing and next-generation robotics Our new GaN integrated circuits enable more ...
Abstract: The threshold voltage shift issue caused by traps in silicon carbide metal-oxide-semiconductor field-effect transistors (SiC MOSFETs) is studied based on transient current method. Experiment ...
Abstract: A high-temperature (HT) SPICE model of the silicon carbide (SiC) nMOS and pMOS along with the transient characteristics is presented in this article. This work extends the BSIM4SiC model, ...
You’ve just finished assembling an electronic project and are ready to power it up, only to realize the battery might be connected backwards. In an instant, a simple mistake can destroy hours of work.
The 5 th generation MOSFET platform features Navitas’ most compact TAP architecture yet, combining the ruggedness of a planar gate with best-in-class performance figures of merit enabled by a trench ...
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