Abstract: A historical review of E-Model development for time-dependent dielectric breakdown (TDDB) is presented. The E-Model tends to be a very useful reliability assurance model for TDDB because of ...
The Final Four is here in all its glory. No. 1 seed Arizona and No. 1 seed Michigan have been on a collision course since Selection Sunday. It's the Game of the Year, and the numbers back it up. This ...
Abstract: The termination structure of SGT MOSFET is related to the breakdown voltage and avalanche ruggedness. The trench termination is introduced into SGT MOSFET, and the breakdown mechanism and ...
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