Duke Pratt School of Engineering

Study Finds Next-Generation Transistor Performance Inflated in Most Lab Testing

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in ...
EDN

In-Circuit Tester for SCR, Diodes, and Transistors

The circuit has been constructed to provide an in-circuit system that will test the integrity of electronic components such as Silicon Controlled Rectifiers, diodes, and PNP or NPN transistors. 4093 – ...
Science Daily

Team reports scalable fabrication of self-aligned graphene transistors, circuits

Researchers previously reported a self-aligned technique for making graphene transistors with unparalleled speed, but scalability was a question. The team now uses a dielectrophoresis assembly ...
NextBigFuture

UCLA team reports scalable fabrication of self-aligned 10-50 gigahertz graphene transistors, circuits

In September 2010, a UCLA research team reported that they had overcome some of these difficulties and were able to fabricate graphene transistors with unparalleled speed. These transistors used a ...